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Details for 2020206154
Up to date per 07.06.2026
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Details
Details for 2020206154
Title / Product Name
ERWEITERTE ANALYTSENSORKALIBRIERUNG UND FEHLERERKENNUNG
Status
Deleted
Protection Type
European Patent
(AT-) Application Number
2020206154
EP Publication Number
3825694
E-Number
1625164
Language
EN
PCT Number
Publication Date
26.05.2021 A
25.10.2023 B1
Registration Date
25.10.2023
AT Publication Date
15.11.2023
Application Date
13.04.2012
Registration Number
-
Priorities
15.04.2011
US
201161476145 P
IPC
G01N 33/66 20060101AFI20210420BHEP
Maximum Duration of Protection
13.04.2032
Owner
DexCom, Inc.
6340 Sequence Drive
San Diego, CA 92121
US
Representative
No representatives present
Inventor
Estes, Michael J.
14537 Crestline Drive
San Diego, CA 92064
US
Simpson, Peter C.
227 N. Vulcan Avenue
Encinitas, CA 92024
US
Kamath, Apurv
3524 Chasewood Drive
San Diego, CA 92111
US
Bohm, Sebastian
5075 Fallenwood Lane
San Diego, CA 92121
US
Rong, Daiting
4766 Caminito Impersado
San Diego, CA 92130
US